Investigates the implementation scheme of cellular automata ( CA) for application in the pseudo-random test of very large scale integration ( VLSI) as a test pattern generator. 研究细胞自动机(CA)在超大规模集成电路(VLSI)伪随机测试中作为测试激励的结构和实现方法。
Inverter block in which the role of inversion is to solve the pseudo-random test generation and automatic test pattern generator ( ATPG) generated test vectors in a conflict between the care bits. 其中翻转控制块的作用是解决伪随机测试生成与自动测试向量生成器(ATPG)生成的测试向量中有冲突的确定位。